Pieter Noordhuis ab37269c38 use max number of intset entries in tests and make SUNION/SINTER/SDIFF tests use less entries

2010-06-13 21:37:46 +02:00

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hash.tcl

tags for existing tests

2010-06-02 23:22:25 +02:00

list.tcl

generated tests for different encodings to avoid test code duplication

2010-06-04 17:05:54 +02:00

set.tcl

use max number of intset entries in tests and make SUNION/SINTER/SDIFF tests use less entries

2010-06-13 21:37:46 +02:00

zset.tcl

tags for existing tests

2010-06-02 23:22:25 +02:00